Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier

Publication TypeJournal Paper
TitleIntegral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier
Author(s)I.O. Agbo
M. Taouil
D.H.P. Kraak
S. Hamdioui
H. Kukner
P Weckx
P. Raghavan
F. Catthoor
Publication DateApril 2017
Journal NameIEEE Transactions On Very Large Scale Integration (VLSI) Systems
Volume25
Issue4
Page Numbers1444-1454
ISSN1063-8210
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "I.O. Agbo and M. Taouil and D.H.P. Kraak and S. Hamdioui and H. Kukner and P Weckx and P. Raghavan and F. Catthoor",
title = "Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier",
journal = "IEEE Transactions On Very Large Scale Integration (VLSI) Systems",
volume = "25",
issue = "4",
month = "April",
year = "2017",
pages = "1444-1454"
}