Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier
Publication Type | Journal Paper |
---|---|
Title | Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier |
Author(s) | I.O. Agbo M. Taouil D.H.P. Kraak S. Hamdioui H. Kukner P Weckx P. Raghavan F. Catthoor |
Publication Date | April 2017 |
Journal Name | IEEE Transactions On Very Large Scale Integration (VLSI) Systems |
Volume | 25 |
Issue | 4 |
Page Numbers | 1444-1454 |
ISSN | 1063-8210 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "I.O. Agbo and M. Taouil and D.H.P. Kraak and S. Hamdioui and H. Kukner and P Weckx and P. Raghavan and F. Catthoor",
title = "Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier",
journal = "IEEE Transactions On Very Large Scale Integration (VLSI) Systems",
volume = "25",
issue = "4",
month = "April",
year = "2017",
pages = "1444-1454"
}
author = "I.O. Agbo and M. Taouil and D.H.P. Kraak and S. Hamdioui and H. Kukner and P Weckx and P. Raghavan and F. Catthoor",
title = "Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier",
journal = "IEEE Transactions On Very Large Scale Integration (VLSI) Systems",
volume = "25",
issue = "4",
month = "April",
year = "2017",
pages = "1444-1454"
}