Computer Engineering Publications Database (2000-2018) Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism 
| Publication Type | Journal Paper |
|---|---|
| Title | Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism |
| Author(s) | A.J. van den Berg P. Ren E.J. Marinissen G.N. Gaydadjiev K.G.W. Goossens |
| Publication Date | July 2010 |
| Journal Name | Journal of Electronic Testing: Theory and Applications |
| Volume | 26 |
| Issue | 4 |
| Page Numbers | 453-464 |
| ISSN | 0923-8174 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "A.J. van den Berg and P. Ren and E.J. Marinissen and G.N. Gaydadjiev and K.G.W. Goossens",
title = "Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "26",
issue = "4",
month = "July",
year = "2010",
pages = "453-464"
}
author = "A.J. van den Berg and P. Ren and E.J. Marinissen and G.N. Gaydadjiev and K.G.W. Goossens",
title = "Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "26",
issue = "4",
month = "July",
year = "2010",
pages = "453-464"
}