Mitigation of sense amplifier degradation using input switching
Publication Type | Conference Paper |
---|---|
Title | Mitigation of sense amplifier degradation using input switching |
Author(s) | D.H.P. Kraak I.O. Agbo M. Taouil S. Hamdioui P Weckx S. Cosemans F. Catthoor W Dehaene |
Publication Date | March 2017 |
Conference Name | Design, Automation and Test in Europe |
Period | 27-31 March 2017 |
Location | Lausanne, Switzerland |
ISBN | 978-3-9815370-8-6 |
Page Numbers | 858-863 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | Reliability |
Theme(s) | Dependable Nano Computing |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "D.H.P. Kraak and I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Mitigation of sense amplifier degradation using input switching",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Lausanne, Switzerland",
month = "March",
year = "2017",
pages = "858-863"
}
author = "D.H.P. Kraak and I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Mitigation of sense amplifier degradation using input switching",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Lausanne, Switzerland",
month = "March",
year = "2017",
pages = "858-863"
}