Mitigation of sense amplifier degradation using input switching 1647_mitigation_of_sense_amplifier_degradation_using_input_switc.pdf

Publication TypeConference Paper
TitleMitigation of sense amplifier degradation using input switching
Author(s)D.H.P. Kraak
I.O. Agbo
M. Taouil
S. Hamdioui
P Weckx
S. Cosemans
F. Catthoor
W Dehaene
Publication DateMarch 2017
Conference NameDesign, Automation and Test in Europe
Period27-31 March 2017
LocationLausanne, Switzerland
ISBN978-3-9815370-8-6
Page Numbers858-863
publishedPublished
Selected PublicationNo
Note
Topic(s)Reliability
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "D.H.P. Kraak and I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Mitigation of sense amplifier degradation using input switching",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Lausanne, Switzerland",
month = "March",
year = "2017",
pages = "858-863"
}