Computer Engineering Publications Database (2000-2018) Reliability issues in RRAM ternary memories affected by variability and aging mechanisms
| Publication Type | Conference Proceedings |
|---|---|
| Title | Reliability issues in RRAM ternary memories affected by variability and aging mechanisms |
| Author(s) | M. Escudero Martinez A. Rubio P. Pouyan |
| Publication Date | July 2017 |
| Conference Name | 23rd IEEE International Symposium on On-Line Testing and Robust System Design |
| Period | 3-5 July 2017 |
| Location | Thessaloniki, Greece |
| ISBN | 978-1-5386-0352-9 |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "M. Escudero Martinez and A. Rubio and P. Pouyan",
title = "Reliability issues in RRAM ternary memories affected by variability and aging mechanisms",
conference = "23rd IEEE International Symposium on On-Line Testing and Robust System Design",
address = "Thessaloniki, Greece",
month = "July",
year = "2017",
editors = ""
}
author = "M. Escudero Martinez and A. Rubio and P. Pouyan",
title = "Reliability issues in RRAM ternary memories affected by variability and aging mechanisms",
conference = "23rd IEEE International Symposium on On-Line Testing and Robust System Design",
address = "Thessaloniki, Greece",
month = "July",
year = "2017",
editors = ""
}