Reliability issues in RRAM ternary memories affected by variability and aging mechanisms

Publication TypeConference Proceedings
TitleReliability issues in RRAM ternary memories affected by variability and aging mechanisms
Author(s)M. Escudero Martinez
A. Rubio
P. Pouyan
Publication DateJuly 2017
Conference Name23rd IEEE International Symposium on On-Line Testing and Robust System Design
Period3-5 July 2017
LocationThessaloniki, Greece
ISBN978-1-5386-0352-9
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "M. Escudero Martinez and A. Rubio and P. Pouyan",
title = "Reliability issues in RRAM ternary memories affected by variability and aging mechanisms",
conference = "23rd IEEE International Symposium on On-Line Testing and Robust System Design",
address = "Thessaloniki, Greece",
month = "July",
year = "2017",
editors = ""
}