Test and Reliability of Emerging Non-Volatile Memories

Publication TypeConference Proceedings
TitleTest and Reliability of Emerging Non-Volatile Memories
Author(s)S. Hamdioui
P. Pouyan
H Li
Y. Wang
A Raychowdhur
I Yoon
Publication DateNovember 2017
Conference Name26th IEEE Asian Test Symposium
Period27-30 November 2017
LocationTaipei, Taiwan
ISBN978-1-5090-5467-1
Editor(s)
publishedTo Appear
Selected PublicationNo
Note
Topic(s)Reliability
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "S. Hamdioui and P. Pouyan and H Li and Y. Wang and A Raychowdhur and I Yoon",
title = "Test and Reliability of Emerging Non-Volatile Memories",
conference = "26th IEEE Asian Test Symposium",
address = "Taipei, Taiwan",
month = "November",
year = "2017",
editors = ""
}