Computer Engineering Publications Database (2000-2018) Test and Reliability of Emerging Non-Volatile Memories
| Publication Type | Conference Proceedings |
|---|---|
| Title | Test and Reliability of Emerging Non-Volatile Memories |
| Author(s) | S. Hamdioui P. Pouyan H Li Y. Wang A Raychowdhur I Yoon |
| Publication Date | November 2017 |
| Conference Name | 26th IEEE Asian Test Symposium |
| Period | 27-30 November 2017 |
| Location | Taipei, Taiwan |
| ISBN | 978-1-5090-5467-1 |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "S. Hamdioui and P. Pouyan and H Li and Y. Wang and A Raychowdhur and I Yoon",
title = "Test and Reliability of Emerging Non-Volatile Memories",
conference = "26th IEEE Asian Test Symposium",
address = "Taipei, Taiwan",
month = "November",
year = "2017",
editors = ""
}
author = "S. Hamdioui and P. Pouyan and H Li and Y. Wang and A Raychowdhur and I Yoon",
title = "Test and Reliability of Emerging Non-Volatile Memories",
conference = "26th IEEE Asian Test Symposium",
address = "Taipei, Taiwan",
month = "November",
year = "2017",
editors = ""
}