DRAM Reliability: Aging Analysis and Reliability Prediction Model

Publication TypeMsc Thesis
TitleDRAM Reliability: Aging Analysis and Reliability Prediction Model
Author(s)M.C.R. Fieback
Advisor(s)S. Hamdioui
M. Taouil
Publication DateDecember 2017
CE Thesis NumberCE-MS-2017-20
Selected PublicationNo
Note
Topic(s)Reliability
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@mastersthesis{,
author = "M.C.R. Fieback",
title = "DRAM Reliability: Aging Analysis and Reliability Prediction Model",
school = "Delft University of Technology",
address = "Delft, Netherlands",
month = "December",
year = "2017"
}