Computer Engineering Publications Database (2000-2018) Ionizing radiation modeling in DRAM transistors
| Publication Type | Conference Paper |
|---|---|
| Title | Ionizing radiation modeling in DRAM transistors |
| Author(s) | M.C.R. Fieback M. Taouil S. Hamdioui M. Rovatti |
| Publication Date | March 2018 |
| Conference Name | IEEE 19th Latin-American Test Symposium |
| Period | 12-16 March 2018 |
| Location | Sao Paulo, Brazil |
| ISBN | 978-1-5386-1472-3 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | Best paper award! |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.C.R. Fieback and M. Taouil and S. Hamdioui and M. Rovatti",
title = "Ionizing radiation modeling in DRAM transistors",
booktitle = "Proc. IEEE 19th Latin-American Test Symposium",
address = "Sao Paulo, Brazil",
month = "March",
year = "2018",
pages = ""
}
author = "M.C.R. Fieback and M. Taouil and S. Hamdioui and M. Rovatti",
title = "Ionizing radiation modeling in DRAM transistors",
booktitle = "Proc. IEEE 19th Latin-American Test Symposium",
address = "Sao Paulo, Brazil",
month = "March",
year = "2018",
pages = ""
}