Computer Engineering Publications Database (2000-2018) Impact and Mitigation of SRAM Read Path Aging
| Publication Type | Journal Paper |
|---|---|
| Title | Impact and Mitigation of SRAM Read Path Aging |
| Author(s) | I.O. Agbo M. Taouil D.H.P. Kraak S. Hamdioui P Weckx S. Cosemans F. Catthoor W Dehaene |
| Publication Date | June 2018 |
| Journal Name | Microelectronics Reliability |
| Volume | 87 |
| Issue | |
| Page Numbers | 158 - 167 |
| ISSN | 0026-2714 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "I.O. Agbo and M. Taouil and D.H.P. Kraak and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Impact and Mitigation of SRAM Read Path Aging",
journal = "Microelectronics Reliability",
volume = "87",
issue = "",
month = "June",
year = "2018",
pages = "158 - 167"
}
author = "I.O. Agbo and M. Taouil and D.H.P. Kraak and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Impact and Mitigation of SRAM Read Path Aging",
journal = "Microelectronics Reliability",
volume = "87",
issue = "",
month = "June",
year = "2018",
pages = "158 - 167"
}