Computer Engineering Publications Database (2000-2018) Degradation analysis of high performance 14nm FinFET SRAM 
| Publication Type | Conference Paper |
|---|---|
| Title | Degradation analysis of high performance 14nm FinFET SRAM |
| Author(s) | D.H.P. Kraak I.O. Agbo M. Taouil S. Hamdioui P Weckx S. Cosemans F. Catthoor |
| Publication Date | March 2018 |
| Conference Name | Design, Automation and Test in Europe |
| Period | 19-23 March 2018 |
| Location | Dresden, Germany |
| ISBN | 978-3-9819263-0-9 |
| Page Numbers | 6 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "D.H.P. Kraak and I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor",
title = "Degradation analysis of high performance 14nm FinFET SRAM",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2018",
pages = "6"
}
author = "D.H.P. Kraak and I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor",
title = "Degradation analysis of high performance 14nm FinFET SRAM",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2018",
pages = "6"
}