Computer Engineering Publications Database (2000-2018) Device Aging: A Reliability and Security Concern 
| Publication Type | Conference Paper |
|---|---|
| Title | Device Aging: A Reliability and Security Concern |
| Author(s) | D.H.P. Kraak M. Taouil S. Hamdioui M. Wasif F. Catthoor A. Chatterjee A. Singh H.J. Wunderlich N. Karimi |
| Publication Date | July 2018 |
| Conference Name | 23rd IEEE European Test Symposium |
| Period | 28 May - 1 June 2018 |
| Location | Bremen, Germany |
| ISBN | 978-1-5386-3728-9 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "D.H.P. Kraak and M. Taouil and S. Hamdioui and M. Wasif and F. Catthoor and A. Chatterjee and A. Singh and H.J. Wunderlich and N. Karimi",
title = "Device Aging: A Reliability and Security Concern",
booktitle = "Proc. 23rd IEEE European Test Symposium",
address = "Bremen, Germany",
month = "July",
year = "2018",
pages = ""
}
author = "D.H.P. Kraak and M. Taouil and S. Hamdioui and M. Wasif and F. Catthoor and A. Chatterjee and A. Singh and H.J. Wunderlich and N. Karimi",
title = "Device Aging: A Reliability and Security Concern",
booktitle = "Proc. 23rd IEEE European Test Symposium",
address = "Bremen, Germany",
month = "July",
year = "2018",
pages = ""
}