Device Aging: A Reliability and Security Concern 1715_device_aging_a_reliability_and_security_concern.pdf

Publication TypeConference Paper
TitleDevice Aging: A Reliability and Security Concern
Author(s)D.H.P. Kraak
M. Taouil
S. Hamdioui
M. Wasif
F. Catthoor
A. Chatterjee
A. Singh
H.J. Wunderlich
N. Karimi
Publication DateJuly 2018
Conference Name23rd IEEE European Test Symposium
Period28 May - 1 June 2018
LocationBremen, Germany
Page Numbers
Selected PublicationNo
Theme(s)Dependable Nano Computing
Group(s)Computer Engineering

IEEE BibTex entry:
author = "D.H.P. Kraak and M. Taouil and S. Hamdioui and M. Wasif and F. Catthoor and A. Chatterjee and A. Singh and H.J. Wunderlich and N. Karimi",
title = "Device Aging: A Reliability and Security Concern",
booktitle = "Proc. 23rd IEEE European Test Symposium",
address = "Bremen, Germany",
month = "July",
year = "2018",
pages = ""