Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing
Publication Type | Conference Paper |
---|---|
Title | Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing |
Author(s) | M. Zandrahimi P. Debaud A. Castillejo Z. Al-Ars |
Publication Date | September 2018 |
Conference Name | 16th IEEE East-West Design & Test Symposium |
Period | 14-17 September 2018 |
Location | Kazan, Russia |
ISBN | 978-1-5386-3299-4 |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | Adaptive Power/Performance Scaling |
Theme(s) | None |
Project(s) | BENEFIC |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M. Zandrahimi and P. Debaud and A. Castillejo and Z. Al-Ars",
title = "Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing",
booktitle = "Proc. 16th IEEE East-West Design & Test Symposium",
address = "Kazan, Russia",
month = "September",
year = "2018",
pages = ""
}
author = "M. Zandrahimi and P. Debaud and A. Castillejo and Z. Al-Ars",
title = "Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing",
booktitle = "Proc. 16th IEEE East-West Design & Test Symposium",
address = "Kazan, Russia",
month = "September",
year = "2018",
pages = ""
}