Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing

Publication TypeConference Paper
TitleCost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing
Author(s)M. Zandrahimi
P. Debaud
A. Castillejo
Z. Al-Ars
Publication DateSeptember 2018
Conference Name16th IEEE East-West Design & Test Symposium
Period14-17 September 2018
LocationKazan, Russia
ISBN978-1-5386-3299-4
Page Numbers
publishedTo Appear
Selected PublicationNo
Note
Topic(s)Adaptive Power/Performance Scaling
Theme(s)None
Project(s)BENEFIC
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M. Zandrahimi and P. Debaud and A. Castillejo and Z. Al-Ars",
title = "Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing",
booktitle = "Proc. 16th IEEE East-West Design & Test Symposium",
address = "Kazan, Russia",
month = "September",
year = "2018",
pages = ""
}