Computer Engineering Publications Database (2000-2018) State of the art and challenges for test and reliability of emerging nonvolatile resistive memories
| Publication Type | Journal Paper |
|---|---|
| Title | State of the art and challenges for test and reliability of emerging nonvolatile resistive memories |
| Author(s) | E. I. Vatajelu P. Pouyan S. Hamdioui |
| Publication Date | October 2017 |
| Journal Name | International Journal of Circuit Theory and Applications |
| Volume | |
| Issue | |
| Page Numbers | 4 - 28 |
| ISSN | 1097-007X (Online) |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "E. I. Vatajelu and P. Pouyan and S. Hamdioui",
title = "State of the art and challenges for test and reliability of emerging nonvolatile resistive memories",
journal = "International Journal of Circuit Theory and Applications",
volume = "",
issue = "",
month = "October",
year = "2017",
pages = "4 - 28"
}
author = "E. I. Vatajelu and P. Pouyan and S. Hamdioui",
title = "State of the art and challenges for test and reliability of emerging nonvolatile resistive memories",
journal = "International Journal of Circuit Theory and Applications",
volume = "",
issue = "",
month = "October",
year = "2017",
pages = "4 - 28"
}