Computer Engineering Publications Database (2000-2018) A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
| Publication Type | Journal Paper |
|---|---|
| Title | A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs |
| Author(s) | G. Cardoso Medeiros L. M. Bolzani Poehls M. Taouil F. Luis Vargas S. Hamdioui |
| Publication Date | September 2018 |
| Journal Name | Microelectronics Reliability |
| Volume | 88-90 |
| Issue | |
| Page Numbers | 355-359 |
| ISSN | 0026-2714 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "G. Cardoso Medeiros and L. M. Bolzani Poehls and M. Taouil and F. Luis Vargas and S. Hamdioui",
title = "A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs",
journal = "Microelectronics Reliability",
volume = "88-90",
issue = "",
month = "September",
year = "2018",
pages = "355-359"
}
author = "G. Cardoso Medeiros and L. M. Bolzani Poehls and M. Taouil and F. Luis Vargas and S. Hamdioui",
title = "A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs",
journal = "Microelectronics Reliability",
volume = "88-90",
issue = "",
month = "September",
year = "2018",
pages = "355-359"
}