Using a CISC microcontroller to test embedded memories

Publication TypeConference Paper
TitleUsing a CISC microcontroller to test embedded memories
Author(s)A.J. van de Goor
S. Hamdioui
G.N. Gaydadjiev
Publication DateApril 2010
Conference Name13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Period14-16 April 2010
LocationVienna, Austria
ISBNt.b.s.
Page Numbers261-266
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and S. Hamdioui and G.N. Gaydadjiev",
title = "Using a CISC microcontroller to test embedded memories",
booktitle = "Proc. 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ",
address = "Vienna, Austria",
month = "April",
year = "2010",
pages = "261-266"
}