Using a CISC microcontroller to test embedded memories
Publication Type | Conference Paper |
---|---|
Title | Using a CISC microcontroller to test embedded memories |
Author(s) | A.J. van de Goor S. Hamdioui G.N. Gaydadjiev |
Publication Date | April 2010 |
Conference Name | 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems |
Period | 14-16 April 2010 |
Location | Vienna, Austria |
ISBN | t.b.s. |
Page Numbers | 261-266 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and S. Hamdioui and G.N. Gaydadjiev",
title = "Using a CISC microcontroller to test embedded memories",
booktitle = "Proc. 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ",
address = "Vienna, Austria",
month = "April",
year = "2010",
pages = "261-266"
}
author = "A.J. van de Goor and S. Hamdioui and G.N. Gaydadjiev",
title = "Using a CISC microcontroller to test embedded memories",
booktitle = "Proc. 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems ",
address = "Vienna, Austria",
month = "April",
year = "2010",
pages = "261-266"
}