On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking

Publication TypeConference Paper
TitleOn the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking
Author(s)J. Verbree
E.J. Marinissen
P. Roussel
D. Velenis
Publication DateMay 2010
Conference Name15th IEEE European Test Symposium
Period25-28 May 2010
LocationPrague, Czech Republic
ISBNt.b.s.
Page Numbers36-41
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "J. Verbree and E.J. Marinissen and P. Roussel and D. Velenis",
title = "On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking",
booktitle = "Proc. 15th IEEE European Test Symposium",
address = "Prague, Czech Republic",
month = "May",
year = "2010",
pages = "36-41"
}