Computer Engineering Publications Database (2000-2018) Memory Testing with a RISC Microcontroller 
| Publication Type | Conference Paper |
|---|---|
| Title | Memory Testing with a RISC Microcontroller |
| Author(s) | A.J. van de Goor G.N. Gaydadjiev S. Hamdioui |
| Publication Date | March 2010 |
| Conference Name | Design, Automation and Test in Europe |
| Period | 8-12 March 2010 |
| Location | Dresden, Germany |
| ISBN | t.b.s. |
| Page Numbers | 214-219 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and G.N. Gaydadjiev and S. Hamdioui",
title = "Memory Testing with a RISC Microcontroller",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2010",
pages = "214-219"
}
author = "A.J. van de Goor and G.N. Gaydadjiev and S. Hamdioui",
title = "Memory Testing with a RISC Microcontroller",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2010",
pages = "214-219"
}