Cost-Effectiveness of Wafer-to-Wafer 3D Chip Stacking with Matching Pre-Tested Wafers
Publication Type | Conference Paper |
---|---|
Title | Cost-Effectiveness of Wafer-to-Wafer 3D Chip Stacking with Matching Pre-Tested Wafers |
Author(s) | J. Verbree E.J. Marinissen P. Roussel D. Velenis |
Publication Date | March 2010 |
Conference Name | Design, Automation and Test in Europe |
Period | 8-12 March 2010 |
Location | Dresden, Germany |
ISBN | n.a. |
Page Numbers | 412-413 |
published | Published |
Selected Publication | No |
Note | Poster at DATE 2010 Friday Workshop |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "J. Verbree and E.J. Marinissen and P. Roussel and D. Velenis",
title = "Cost-Effectiveness of Wafer-to-Wafer 3D Chip Stacking with Matching Pre-Tested Wafers",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2010",
pages = "412-413"
}
author = "J. Verbree and E.J. Marinissen and P. Roussel and D. Velenis",
title = "Cost-Effectiveness of Wafer-to-Wafer 3D Chip Stacking with Matching Pre-Tested Wafers",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2010",
pages = "412-413"
}