Cost-Effectiveness of Wafer-to-Wafer 3D Chip Stacking with Matching Pre-Tested Wafers

Publication TypeConference Paper
TitleCost-Effectiveness of Wafer-to-Wafer 3D Chip Stacking with Matching Pre-Tested Wafers
Author(s)J. Verbree
E.J. Marinissen
P. Roussel
D. Velenis
Publication DateMarch 2010
Conference NameDesign, Automation and Test in Europe
Period8-12 March 2010
LocationDresden, Germany
ISBNn.a.
Page Numbers412-413
publishedPublished
Selected PublicationNo
NotePoster at DATE 2010 Friday Workshop
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "J. Verbree and E.J. Marinissen and P. Roussel and D. Velenis",
title = "Cost-Effectiveness of Wafer-to-Wafer 3D Chip Stacking with Matching Pre-Tested Wafers",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2010",
pages = "412-413"
}