Computer Engineering Publications Database (2000-2018) Fault Tolerance Architecture for Reliable Hybrid CMOS/Nanodevice Memories 
| Publication Type | Conference Paper |
|---|---|
| Title | Fault Tolerance Architecture for Reliable Hybrid CMOS/Nanodevice Memories |
| Author(s) | N.Z.B. Haron S. Hamdioui |
| Publication Date | May 2009 |
| Conference Name | 14th IEEE European Test Symposium |
| Period | 25-29 May 2009 |
| Location | Sevilla, Spain |
| ISBN | 978-0-7695-3703-0 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "N.Z.B. Haron and S. Hamdioui",
title = "Fault Tolerance Architecture for Reliable Hybrid CMOS/Nanodevice Memories",
booktitle = "Proc. 14th IEEE European Test Symposium",
address = "Sevilla, Spain",
month = "May",
year = "2009",
pages = ""
}
author = "N.Z.B. Haron and S. Hamdioui",
title = "Fault Tolerance Architecture for Reliable Hybrid CMOS/Nanodevice Memories",
booktitle = "Proc. 14th IEEE European Test Symposium",
address = "Sevilla, Spain",
month = "May",
year = "2009",
pages = ""
}