Computer Engineering Publications Database (2000-2018) Scan More with Memory Scan Test 
| Publication Type | Conference Paper |
|---|---|
| Title | Scan More with Memory Scan Test |
| Author(s) | S. Hamdioui Z. Al-Ars |
| Publication Date | April 2009 |
| Conference Name | 4th International Conference on Design & Technology of Integrated Systems in Nanoscale Era |
| Period | 6-9 April 2009 |
| Location | Cairo, Egypt |
| ISBN | t.b.s. |
| Page Numbers | 204-209 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars",
title = "Scan More with Memory Scan Test",
booktitle = "Proc. 4th International Conference on Design & Technology of Integrated Systems in Nanoscale Era",
address = "Cairo, Egypt",
month = "April",
year = "2009",
pages = "204-209"
}
author = "S. Hamdioui and Z. Al-Ars",
title = "Scan More with Memory Scan Test",
booktitle = "Proc. 4th International Conference on Design & Technology of Integrated Systems in Nanoscale Era",
address = "Cairo, Egypt",
month = "April",
year = "2009",
pages = "204-209"
}