Computer Engineering Publications Database (2000-2018) Why is CMOS scaling coming to an END? 
| Publication Type | Conference Paper |
|---|---|
| Title | Why is CMOS scaling coming to an END? |
| Author(s) | N.Z.B. Haron S. Hamdioui |
| Publication Date | December 2008 |
| Conference Name | 3rd IEEE International Design and Test Workshop |
| Period | 20-22 December 2008 |
| Location | Monastir, Tunisia |
| ISBN | t.b.s. |
| Page Numbers | 98-103 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "N.Z.B. Haron and S. Hamdioui",
title = "Why is CMOS scaling coming to an END?",
booktitle = "Proc. 3rd IEEE International Design and Test Workshop",
address = "Monastir, Tunisia",
month = "December",
year = "2008",
pages = "98-103"
}
author = "N.Z.B. Haron and S. Hamdioui",
title = "Why is CMOS scaling coming to an END?",
booktitle = "Proc. 3rd IEEE International Design and Test Workshop",
address = "Monastir, Tunisia",
month = "December",
year = "2008",
pages = "98-103"
}