Efficient Tests and DFT for RAM Address Decoder Delay Faults
Publication Type | Conference Paper |
---|---|
Title | Efficient Tests and DFT for RAM Address Decoder Delay Faults |
Author(s) | S. Hamdioui Z. Al-Ars |
Publication Date | December 2008 |
Conference Name | 3rd IEEE International Design and Test Workshop |
Period | 20-22 December 2008 |
Location | Monastir, Tunisia |
ISBN | t.b.s. |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars",
title = "Efficient Tests and DFT for RAM Address Decoder Delay Faults",
booktitle = "Proc. 3rd IEEE International Design and Test Workshop",
address = "Monastir, Tunisia",
month = "December",
year = "2008",
pages = ""
}
author = "S. Hamdioui and Z. Al-Ars",
title = "Efficient Tests and DFT for RAM Address Decoder Delay Faults",
booktitle = "Proc. 3rd IEEE International Design and Test Workshop",
address = "Monastir, Tunisia",
month = "December",
year = "2008",
pages = ""
}