Efficient Tests and DFT for RAM Address Decoder Delay Faults 515_efficient_tests_and_dft_for_ram_address_decoder_delay_faults.pdf

Publication TypeConference Paper
TitleEfficient Tests and DFT for RAM Address Decoder Delay Faults
Author(s)S. Hamdioui
Z. Al-Ars
Publication DateDecember 2008
Conference Name3rd IEEE International Design and Test Workshop
Period20-22 December 2008
LocationMonastir, Tunisia
ISBNt.b.s.
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars",
title = "Efficient Tests and DFT for RAM Address Decoder Delay Faults",
booktitle = "Proc. 3rd IEEE International Design and Test Workshop",
address = "Monastir, Tunisia",
month = "December",
year = "2008",
pages = ""
}