Computer Engineering Publications Database (2000-2018) CMOS scaling impacts on Reliability, What do we understand? 
| Publication Type | Conference Paper |
|---|---|
| Title | CMOS scaling impacts on Reliability, What do we understand? |
| Author(s) | M.S. Khan S. Hamdioui N.Z.B. Haron |
| Publication Date | November 2008 |
| Conference Name | 19th Annual Workshop on Circuits, Systems and Signal Processing |
| Period | 27-28 November 2008 |
| Location | Veldhoven, The Netherlands |
| ISBN | t.b.s. |
| Page Numbers | 260-266 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and N.Z.B. Haron",
title = "CMOS scaling impacts on Reliability, What do we understand?",
booktitle = "Proc. 19th Annual Workshop on Circuits, Systems and Signal Processing",
address = "Veldhoven, The Netherlands",
month = "November",
year = "2008",
pages = "260-266"
}
author = "M.S. Khan and S. Hamdioui and N.Z.B. Haron",
title = "CMOS scaling impacts on Reliability, What do we understand?",
booktitle = "Proc. 19th Annual Workshop on Circuits, Systems and Signal Processing",
address = "Veldhoven, The Netherlands",
month = "November",
year = "2008",
pages = "260-266"
}