Computer Engineering Publications Database (2000-2018) Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs 
| Publication Type | Conference Paper |
|---|---|
| Title | Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs |
| Author(s) | Z. Al-Ars S. Hamdioui A.J. van de Goor G. Mueller |
| Publication Date | October 2008 |
| Conference Name | IEEE International Test Conference |
| Period | 26-31 October 2008 |
| Location | Santa Clara, USA |
| ISBN | 978-1-4244-2403-0 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui and A.J. van de Goor and G. Mueller",
title = "Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs",
booktitle = "Proc. IEEE International Test Conference",
address = "Santa Clara, USA",
month = "October",
year = "2008",
pages = ""
}
author = "Z. Al-Ars and S. Hamdioui and A.J. van de Goor and G. Mueller",
title = "Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs",
booktitle = "Proc. IEEE International Test Conference",
address = "Santa Clara, USA",
month = "October",
year = "2008",
pages = ""
}