Optimizing Test Length for Soft Faults in DRAM Devices 621_optimizing_test_length_for_soft_faults_in_dram_devices.pdf

Publication TypeConference Paper
TitleOptimizing Test Length for Soft Faults in DRAM Devices
Author(s)Z. Al-Ars
S. Hamdioui
G.N. Gaydadjiev
Publication DateMay 2007
Conference Name25th IEEE VLSI Test Symposium
Period6-10 May 2007
LocationBerkeley, USA
ISBN978-0-7695-2812-0
Page Numbers59-66
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui and G.N. Gaydadjiev",
title = "Optimizing Test Length for Soft Faults in DRAM Devices",
booktitle = "Proc. 25th IEEE VLSI Test Symposium",
address = "Berkeley, USA",
month = "May",
year = "2007",
pages = "59-66"
}