Computer Engineering Publications Database (2000-2018) Optimizing Test Length for Soft Faults in DRAM Devices 
| Publication Type | Conference Paper |
|---|---|
| Title | Optimizing Test Length for Soft Faults in DRAM Devices |
| Author(s) | Z. Al-Ars S. Hamdioui G.N. Gaydadjiev |
| Publication Date | May 2007 |
| Conference Name | 25th IEEE VLSI Test Symposium |
| Period | 6-10 May 2007 |
| Location | Berkeley, USA |
| ISBN | 978-0-7695-2812-0 |
| Page Numbers | 59-66 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui and G.N. Gaydadjiev",
title = "Optimizing Test Length for Soft Faults in DRAM Devices",
booktitle = "Proc. 25th IEEE VLSI Test Symposium",
address = "Berkeley, USA",
month = "May",
year = "2007",
pages = "59-66"
}
author = "Z. Al-Ars and S. Hamdioui and G.N. Gaydadjiev",
title = "Optimizing Test Length for Soft Faults in DRAM Devices",
booktitle = "Proc. 25th IEEE VLSI Test Symposium",
address = "Berkeley, USA",
month = "May",
year = "2007",
pages = "59-66"
}