Computer Engineering Publications Database (2000-2018) Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories
| Publication Type | Conference Paper |
|---|---|
| Title | Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories |
| Author(s) | M. Taouil S. Hamdioui |
| Publication Date | May 2011 |
| Conference Name | 16th IEEE European Test Symposium |
| Period | 23-27 May 2011 |
| Location | Trondheim, Norway |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M. Taouil and S. Hamdioui",
title = "Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories",
booktitle = "Proc. 16th IEEE European Test Symposium",
address = "Trondheim, Norway",
month = "May",
year = "2011",
pages = ""
}
author = "M. Taouil and S. Hamdioui",
title = "Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories",
booktitle = "Proc. 16th IEEE European Test Symposium",
address = "Trondheim, Norway",
month = "May",
year = "2011",
pages = ""
}