Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost
Publication Type | Conference Paper |
---|---|
Title | Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost |
Author(s) | M. Taouil S. Hamdioui |
Publication Date | April 2011 |
Conference Name | 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems |
Period | 13-14 April 2011 |
Location | Cottbus, Germany |
ISBN | t.b.s. |
Page Numbers | 335-341 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M. Taouil and S. Hamdioui",
title = "Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost",
booktitle = "Proc. 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
pages = "335-341"
}
author = "M. Taouil and S. Hamdioui",
title = "Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost",
booktitle = "Proc. 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
pages = "335-341"
}