Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost

Publication TypeConference Paper
TitleStacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost
Author(s)M. Taouil
S. Hamdioui
Publication DateApril 2011
Conference Name14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Period13-14 April 2011
LocationCottbus, Germany
ISBNt.b.s.
Page Numbers335-341
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M. Taouil and S. Hamdioui",
title = "Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost",
booktitle = "Proc. 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
pages = "335-341"
}