Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture
Publication Type | Conference Paper |
---|---|
Title | Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture |
Author(s) | A. Strano C.G. Requena D. Ludovici M.E. Gómez M. Favalli D. Bertozzi |
Publication Date | March 2011 |
Conference Name | Design, Automation and Test in Europe |
Period | 14-18 March 2011 |
Location | Grenoble, France |
ISBN | t.b.s. |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A. Strano and C.G. Requena and D. Ludovici and M.E. Gómez and M. Favalli and D. Bertozzi",
title = "Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Grenoble, France",
month = "March",
year = "2011",
pages = ""
}
author = "A. Strano and C.G. Requena and D. Ludovici and M.E. Gómez and M. Favalli and D. Bertozzi",
title = "Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture",
booktitle = "Proc. Design, Automation and Test in Europe",
address = "Grenoble, France",
month = "March",
year = "2011",
pages = ""
}