Computer Engineering Publications Database (2000-2018) Comparison of Static and Dynamic Faults in 65nm Memory Technology 
| Publication Type | Conference Paper |
|---|---|
| Title | Comparison of Static and Dynamic Faults in 65nm Memory Technology |
| Author(s) | S. Hamdioui Z. Al-Ars G.N. Gaydadjiev J.D. Reyes |
| Publication Date | November 2006 |
| Conference Name | 1st IEEE International Design and Test Workshop |
| Period | 19-20 November 2006 |
| Location | Dubai, UAE |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars and G.N. Gaydadjiev and J.D. Reyes",
title = "Comparison of Static and Dynamic Faults in 65nm Memory Technology",
booktitle = "Proc. 1st IEEE International Design and Test Workshop ",
address = "Dubai, UAE",
month = "November",
year = "2006",
pages = ""
}
author = "S. Hamdioui and Z. Al-Ars and G.N. Gaydadjiev and J.D. Reyes",
title = "Comparison of Static and Dynamic Faults in 65nm Memory Technology",
booktitle = "Proc. 1st IEEE International Design and Test Workshop ",
address = "Dubai, UAE",
month = "November",
year = "2006",
pages = ""
}