Computer Engineering Publications Database (2000-2018) Impact of Stresses on the Fault Coverage of Memory Tests 
| Publication Type | Conference Paper |
|---|---|
| Title | Impact of Stresses on the Fault Coverage of Memory Tests |
| Author(s) | S. Hamdioui Z. Al-Ars A.J. van de Goor R. Wadsworth |
| Publication Date | August 2005 |
| Conference Name | IEEE International Workshop on Memory Technology, Design and Testing |
| Period | 3-5 August 2005 |
| Location | Taipei, Taiwan |
| ISBN | 0-7695-2313-7 |
| Page Numbers | 103-108 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and R. Wadsworth",
title = "Impact of Stresses on the Fault Coverage of Memory Tests",
booktitle = "Proc. IEEE International Workshop on Memory Technology, Design and Testing",
address = "Taipei, Taiwan",
month = "August",
year = "2005",
pages = "103-108"
}
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and R. Wadsworth",
title = "Impact of Stresses on the Fault Coverage of Memory Tests",
booktitle = "Proc. IEEE International Workshop on Memory Technology, Design and Testing",
address = "Taipei, Taiwan",
month = "August",
year = "2005",
pages = "103-108"
}