Impact of Stresses on the Fault Coverage of Memory Tests 819_impact_of_stresses_on_the_fault_coverage_of_memory_tests.pdf

Publication TypeConference Paper
TitleImpact of Stresses on the Fault Coverage of Memory Tests
Author(s)S. Hamdioui
Z. Al-Ars
A.J. van de Goor
R. Wadsworth
Publication DateAugust 2005
Conference NameIEEE International Workshop on Memory Technology, Design and Testing
Period3-5 August 2005
LocationTaipei, Taiwan
ISBN0-7695-2313-7
Page Numbers103-108
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and R. Wadsworth",
title = "Impact of Stresses on the Fault Coverage of Memory Tests",
booktitle = "Proc. IEEE International Workshop on Memory Technology, Design and Testing",
address = "Taipei, Taiwan",
month = "August",
year = "2005",
pages = "103-108"
}