Computer Engineering Publications Database (2000-2018) Framework for Fault Analysis and Test Generation in DRAMs 
| Publication Type | Conference Paper |
|---|---|
| Title | Framework for Fault Analysis and Test Generation in DRAMs |
| Author(s) | Z. Al-Ars S. Hamdioui G. Mueller A.J. van de Goor |
| Publication Date | March 2005 |
| Conference Name | Design, Automation and Test in Europe Conference and Exposition |
| Period | 7-11 March 2005 |
| Location | Munich, Germany |
| ISBN | 0-7695-2288-2 |
| Page Numbers | 1020-1021 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui and G. Mueller and A.J. van de Goor",
title = "Framework for Fault Analysis and Test Generation in DRAMs",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Munich, Germany",
month = "March",
year = "2005",
pages = "1020-1021"
}
author = "Z. Al-Ars and S. Hamdioui and G. Mueller and A.J. van de Goor",
title = "Framework for Fault Analysis and Test Generation in DRAMs",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Munich, Germany",
month = "March",
year = "2005",
pages = "1020-1021"
}