Computer Engineering Publications Database (2000-2018) Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach 
| Publication Type | Conference Paper |
|---|---|
| Title | Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach |
| Author(s) | Z. Al-Ars S. Hamdioui J. Vollrath |
| Publication Date | December 2005 |
| Conference Name | 14th Asian Test Symposium |
| Period | 18-21 December 2005 |
| Location | Calcutta, India |
| ISBN | 0-7695-2481-8 |
| Page Numbers | 434-439 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui and J. Vollrath",
title = "Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach",
booktitle = "Proc. 14th Asian Test Symposium",
address = "Calcutta, India",
month = "December",
year = "2005",
pages = "434-439"
}
author = "Z. Al-Ars and S. Hamdioui and J. Vollrath",
title = "Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach",
booktitle = "Proc. 14th Asian Test Symposium",
address = "Calcutta, India",
month = "December",
year = "2005",
pages = "434-439"
}