Computer Engineering Publications Database (2000-2018) The Effectiveness of Scan Test and Its New Variants 
| Publication Type | Conference Paper |
|---|---|
| Title | The Effectiveness of Scan Test and Its New Variants |
| Author(s) | A.J. van de Goor S. Hamdioui Z. Al-Ars |
| Publication Date | August 2004 |
| Conference Name | 12th IEEE International Workshop on Memory Technology, Design, and Testing |
| Period | 9-10 August 2004 |
| Location | San Jose, USA |
| ISBN | 0-7695-2193-2 |
| Page Numbers | 26-31 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and S. Hamdioui and Z. Al-Ars",
title = "The Effectiveness of Scan Test and Its New Variants",
booktitle = "Proc. 12th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2004",
pages = "26-31"
}
author = "A.J. van de Goor and S. Hamdioui and Z. Al-Ars",
title = "The Effectiveness of Scan Test and Its New Variants",
booktitle = "Proc. 12th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2004",
pages = "26-31"
}