Computer Engineering Publications Database (2000-2018) The State-of-the-art and Future Trends in Testing Embedded Memories 
| Publication Type | Conference Paper |
|---|---|
| Title | The State-of-the-art and Future Trends in Testing Embedded Memories |
| Author(s) | S. Hamdioui G.N. Gaydadjiev A.J. van de Goor |
| Publication Date | August 2004 |
| Conference Name | 12th IEEE International Workshop on Memory Technology, Design, and Testing |
| Period | 9-10 August 2004 |
| Location | San Jose, USA |
| ISBN | 0-7695-2193-2 |
| Page Numbers | 54-59 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and G.N. Gaydadjiev and A.J. van de Goor",
title = "The State-of-the-art and Future Trends in Testing Embedded Memories",
booktitle = "Proc. 12th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2004",
pages = "54-59"
}
author = "S. Hamdioui and G.N. Gaydadjiev and A.J. van de Goor",
title = "The State-of-the-art and Future Trends in Testing Embedded Memories",
booktitle = "Proc. 12th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2004",
pages = "54-59"
}