Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results
Publication Type | Journal Paper |
---|---|
Title | Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results |
Author(s) | S. Hamdioui Z. Al-Ars A.J. van de Goor M. Rodgers |
Publication Date | May 2004 |
Journal Name | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Volume | 23 |
Issue | 5 |
Page Numbers | 737-757 |
ISSN | 0278-0070 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and M. Rodgers",
title = "Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "23",
issue = "5",
month = "May",
year = "2004",
pages = "737-757"
}
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and M. Rodgers",
title = "Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "23",
issue = "5",
month = "May",
year = "2004",
pages = "737-757"
}