Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results 931_linked_faults_in_random_access_memories_concept_fault_mode.pdf

Publication TypeJournal Paper
TitleLinked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results
Author(s)S. Hamdioui
Z. Al-Ars
A.J. van de Goor
M. Rodgers
Publication DateMay 2004
Journal NameIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume23
Issue5
Page Numbers737-757
ISSN0278-0070
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and M. Rodgers",
title = "Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "23",
issue = "5",
month = "May",
year = "2004",
pages = "737-757"
}