Computer Engineering Publications Database (2000-2018) Soft Faults and the Importance of Stresses in Memory Testing 
| Publication Type | Conference Paper |
|---|---|
| Title | Soft Faults and the Importance of Stresses in Memory Testing |
| Author(s) | Z. Al-Ars A.J. van de Goor |
| Publication Date | February 2004 |
| Conference Name | Design, Automation and Test in Europe Conference and Exposition |
| Period | 16-20 February 2004 |
| Location | Paris, France |
| ISBN | 0-7695-2085-5 |
| Page Numbers | 1084-1089 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Soft Faults and the Importance of Stresses in Memory Testing",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Paris, France",
month = "February",
year = "2004",
pages = "1084-1089"
}
author = "Z. Al-Ars and A.J. van de Goor",
title = "Soft Faults and the Importance of Stresses in Memory Testing",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Paris, France",
month = "February",
year = "2004",
pages = "1084-1089"
}