Computer Engineering Publications Database (2000-2018) On Defect Oriented Testing for Hybrid CMOS/memristor Memory 
| Publication Type | Conference Paper |
|---|---|
| Title | On Defect Oriented Testing for Hybrid CMOS/memristor Memory |
| Author(s) | N.Z.B. Haron S. Hamdioui |
| Publication Date | November 2011 |
| Conference Name | 20th Asian Test Symposium |
| Period | 20-23 November 2011 |
| Location | New Delhi, India |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "N.Z.B. Haron and S. Hamdioui",
title = "On Defect Oriented Testing for Hybrid CMOS/memristor Memory",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = ""
}
author = "N.Z.B. Haron and S. Hamdioui",
title = "On Defect Oriented Testing for Hybrid CMOS/memristor Memory",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = ""
}