Computer Engineering Publications Database (2000-2018) Systematic memory test generation for dram defects causing two floating nodes 
| Publication Type | Conference Paper |
|---|---|
| Title | Systematic memory test generation for dram defects causing two floating nodes |
| Author(s) | Z. Al-Ars A.J. van de Goor |
| Publication Date | July 2003 |
| Conference Name | 11th IEEE International Workshop on Memory Technology, Design, and Testing |
| Period | 28-29 July 2003 |
| Location | San Jose, USA |
| ISBN | 0-7695-2004-9 |
| Page Numbers | 27-32 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Systematic memory test generation for dram defects causing two floating nodes",
booktitle = "Proc. 11th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "July",
year = "2003",
pages = "27-32"
}
author = "Z. Al-Ars and A.J. van de Goor",
title = "Systematic memory test generation for dram defects causing two floating nodes",
booktitle = "Proc. 11th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "July",
year = "2003",
pages = "27-32"
}