Computer Engineering Publications Database (2000-2018) NBTI Monitoring and Design for Reliability in Nanoscale Circuits 
| Publication Type | Conference Paper |
|---|---|
| Title | NBTI Monitoring and Design for Reliability in Nanoscale Circuits |
| Author(s) | M.S. Khan S. Hamdioui N.Z.B. Haron F. Catthoor |
| Publication Date | October 2011 |
| Conference Name | IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Period | 3-5 October 2011 |
| Location | Vancouver, Canada |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and N.Z.B. Haron and F. Catthoor",
title = "NBTI Monitoring and Design for Reliability in Nanoscale Circuits",
booktitle = "Proc. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
address = "Vancouver, Canada",
month = "October",
year = "2011",
pages = ""
}
author = "M.S. Khan and S. Hamdioui and N.Z.B. Haron and F. Catthoor",
title = "NBTI Monitoring and Design for Reliability in Nanoscale Circuits",
booktitle = "Proc. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
address = "Vancouver, Canada",
month = "October",
year = "2011",
pages = ""
}