Minimal test for coupling faults in word-oriented memories
Publication Type | Conference Paper |
---|---|
Title | Minimal test for coupling faults in word-oriented memories |
Author(s) | A.J. van de Goor M.S. Abadir J.F. Carlin |
Publication Date | March 2002 |
Conference Name | Design, Automation and Test in Europe Conference and Exposition |
Period | 4-8 March 2002 |
Location | Paris, France |
ISBN | 0-7695-1471-5 |
Page Numbers | 944-948 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and M.S. Abadir and J.F. Carlin",
title = "Minimal test for coupling faults in word-oriented memories",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Paris, France",
month = "March",
year = "2002",
pages = "944-948"
}
author = "A.J. van de Goor and M.S. Abadir and J.F. Carlin",
title = "Minimal test for coupling faults in word-oriented memories",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Paris, France",
month = "March",
year = "2002",
pages = "944-948"
}