Minimal test for coupling faults in word-oriented memories 1125_minimal_test_for_coupling_faults_in_wordoriented_memories.pdf

Publication TypeConference Paper
TitleMinimal test for coupling faults in word-oriented memories
Author(s)A.J. van de Goor
M.S. Abadir
J.F. Carlin
Publication DateMarch 2002
Conference NameDesign, Automation and Test in Europe Conference and Exposition
Period4-8 March 2002
LocationParis, France
ISBN0-7695-1471-5
Page Numbers944-948
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and M.S. Abadir and J.F. Carlin",
title = "Minimal test for coupling faults in word-oriented memories",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Paris, France",
month = "March",
year = "2002",
pages = "944-948"
}