Computer Engineering Publications Database (2000-2018) Modeling techniques and tests for partial faults in memory devices 
| Publication Type | Conference Paper |
|---|---|
| Title | Modeling techniques and tests for partial faults in memory devices |
| Author(s) | Z. Al-Ars A.J. van de Goor |
| Publication Date | March 2002 |
| Conference Name | Design, Automation and Test in Europe Conference and Exposition |
| Period | 4-8 March 2002 |
| Location | Paris, France |
| ISBN | 0-7695-1471-5 |
| Page Numbers | 89-93 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Modeling techniques and tests for partial faults in memory devices",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Paris, France",
month = "March",
year = "2002",
pages = "89-93"
}
author = "Z. Al-Ars and A.J. van de Goor",
title = "Modeling techniques and tests for partial faults in memory devices",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Paris, France",
month = "March",
year = "2002",
pages = "89-93"
}