Computer Engineering Publications Database (2000-2018) Testing static and dynamic faults in random access memories 
| Publication Type | Conference Paper |
|---|---|
| Title | Testing static and dynamic faults in random access memories |
| Author(s) | S. Hamdioui Z. Al-Ars A.J. van de Goor |
| Publication Date | January 2002 |
| Conference Name | 20th IEEE VLSI Test Symposium |
| Period | 28 April - 2 May 2002 |
| Location | Monterey, USA |
| ISBN | 0-7695-1570-3 |
| Page Numbers | 395-400 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor",
title = "Testing static and dynamic faults in random access memories",
booktitle = "Proc. 20th IEEE VLSI Test Symposium",
address = "Monterey, USA",
month = "January",
year = "2002",
pages = "395-400"
}
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor",
title = "Testing static and dynamic faults in random access memories",
booktitle = "Proc. 20th IEEE VLSI Test Symposium",
address = "Monterey, USA",
month = "January",
year = "2002",
pages = "395-400"
}