Computer Engineering Publications Database (2000-2018) Realistic fault models and test procedure for multi-port SRAMs 
| Publication Type | Conference Paper |
|---|---|
| Title | Realistic fault models and test procedure for multi-port SRAMs |
| Author(s) | S. Hamdioui A.J. van de Goor D. Eastwick M. Rodgers |
| Publication Date | August 2001 |
| Conference Name | 9th IEEE International Workshop on Memory Technology, Design, and Testing |
| Period | 6-7 August 2001 |
| Location | San Jose, USA |
| ISBN | 0-7695-1242-9 |
| Page Numbers | 65-72 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and A.J. van de Goor and D. Eastwick and M. Rodgers",
title = "Realistic fault models and test procedure for multi-port SRAMs",
booktitle = "Proc. 9th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2001",
pages = "65-72"
}
author = "S. Hamdioui and A.J. van de Goor and D. Eastwick and M. Rodgers",
title = "Realistic fault models and test procedure for multi-port SRAMs",
booktitle = "Proc. 9th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2001",
pages = "65-72"
}