Computer Engineering Publications Database (2000-2018) Transient faults in DRAMs: concept, analysis and impact on tests 
| Publication Type | Conference Paper |
|---|---|
| Title | Transient faults in DRAMs: concept, analysis and impact on tests |
| Author(s) | Z. Al-Ars A.J. van de Goor |
| Publication Date | August 2001 |
| Conference Name | 9th IEEE International Workshop on Memory Technology, Design, and Testing |
| Period | 6-7 August 2001 |
| Location | San Jose, USA |
| ISBN | 0-7695-1242-9 |
| Page Numbers | 59-64 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Transient faults in DRAMs: concept, analysis and impact on tests",
booktitle = "Proc. 9th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2001",
pages = "59-64"
}
author = "Z. Al-Ars and A.J. van de Goor",
title = "Transient faults in DRAMs: concept, analysis and impact on tests",
booktitle = "Proc. 9th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2001",
pages = "59-64"
}