Transient faults in DRAMs: concept, analysis and impact on tests 1181_transient_faults_in_drams_concept_analysis_and_impact_on.pdf

Publication TypeConference Paper
TitleTransient faults in DRAMs: concept, analysis and impact on tests
Author(s)Z. Al-Ars
A.J. van de Goor
Publication DateAugust 2001
Conference Name9th IEEE International Workshop on Memory Technology, Design, and Testing
Period6-7 August 2001
LocationSan Jose, USA
ISBN0-7695-1242-9
Page Numbers59-64
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Transient faults in DRAMs: concept, analysis and impact on tests",
booktitle = "Proc. 9th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2001",
pages = "59-64"
}