Computer Engineering Publications Database (2000-2018) Detecting unique faults in multi-port SRAMs 
| Publication Type | Conference Paper |
|---|---|
| Title | Detecting unique faults in multi-port SRAMs |
| Author(s) | S. Hamdioui A.J. van de Goor D. Eastwick M. Rodgers |
| Publication Date | November 2001 |
| Conference Name | 10th Asian Test Symposium |
| Period | 19-21 November 2001 |
| Location | Kyoto, Japan |
| ISBN | 0-7695-1378-6 |
| Page Numbers | 37-42 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and A.J. van de Goor and D. Eastwick and M. Rodgers",
title = "Detecting unique faults in multi-port SRAMs",
booktitle = "Proc. 10th Asian Test Symposium",
address = "Kyoto, Japan",
month = "November",
year = "2001",
pages = "37-42"
}
author = "S. Hamdioui and A.J. van de Goor and D. Eastwick and M. Rodgers",
title = "Detecting unique faults in multi-port SRAMs",
booktitle = "Proc. 10th Asian Test Symposium",
address = "Kyoto, Japan",
month = "November",
year = "2001",
pages = "37-42"
}