Comparative BTI Analysis in Nano-scale Circuits Lifetime
Publication Type | Conference Paper |
---|---|
Title | Comparative BTI Analysis in Nano-scale Circuits Lifetime |
Author(s) | M.S. Khan S. Hamdioui F. Catthoor |
Publication Date | January 2012 |
Conference Name | 4th Workshop on Design for Reliability |
Period | 23-25 January 2012 |
Location | Paris, France |
ISBN | t.b.s. |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and F. Catthoor",
title = "Comparative BTI Analysis in Nano-scale Circuits Lifetime",
booktitle = "Proc. 4th Workshop on Design for Reliability",
address = "Paris, France",
month = "January",
year = "2012",
pages = ""
}
author = "M.S. Khan and S. Hamdioui and F. Catthoor",
title = "Comparative BTI Analysis in Nano-scale Circuits Lifetime",
booktitle = "Proc. 4th Workshop on Design for Reliability",
address = "Paris, France",
month = "January",
year = "2012",
pages = ""
}