Comparative BTI Analysis in Nano-scale Circuits Lifetime 122_comparative_bti_analysis_in_nanoscale_circuits_lifetime.pdf

Publication TypeConference Paper
TitleComparative BTI Analysis in Nano-scale Circuits Lifetime
Author(s)M.S. Khan
S. Hamdioui
F. Catthoor
Publication DateJanuary 2012
Conference Name4th Workshop on Design for Reliability
Period23-25 January 2012
LocationParis, France
ISBNt.b.s.
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and F. Catthoor",
title = "Comparative BTI Analysis in Nano-scale Circuits Lifetime",
booktitle = "Proc. 4th Workshop on Design for Reliability",
address = "Paris, France",
month = "January",
year = "2012",
pages = ""
}