Simulation and development of short transparent tests for RAM 1223_simulation_and_development_of_short_transparent_tests_for_r.pdf

Publication TypeConference Paper
TitleSimulation and development of short transparent tests for RAM
Author(s)S.N. Demidenko
A.J. van de Goor
S. Henderson
P. Knoppers
Publication DateNovember 2001
Conference Name10th Asian Test Symposium
Period19-21 November 2001
LocationKyoto, Japan
ISBN0-7695-1378-6
Page Numbers164-169
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "S.N. Demidenko and A.J. van de Goor and S. Henderson and P. Knoppers",
title = "Simulation and development of short transparent tests for RAM",
booktitle = "Proc. 10th Asian Test Symposium",
address = "Kyoto, Japan",
month = "November",
year = "2001",
pages = "164-169"
}