Simulation and development of short transparent tests for RAM
Publication Type | Conference Paper |
---|---|
Title | Simulation and development of short transparent tests for RAM |
Author(s) | S.N. Demidenko A.J. van de Goor S. Henderson P. Knoppers |
Publication Date | November 2001 |
Conference Name | 10th Asian Test Symposium |
Period | 19-21 November 2001 |
Location | Kyoto, Japan |
ISBN | 0-7695-1378-6 |
Page Numbers | 164-169 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S.N. Demidenko and A.J. van de Goor and S. Henderson and P. Knoppers",
title = "Simulation and development of short transparent tests for RAM",
booktitle = "Proc. 10th Asian Test Symposium",
address = "Kyoto, Japan",
month = "November",
year = "2001",
pages = "164-169"
}
author = "S.N. Demidenko and A.J. van de Goor and S. Henderson and P. Knoppers",
title = "Simulation and development of short transparent tests for RAM",
booktitle = "Proc. 10th Asian Test Symposium",
address = "Kyoto, Japan",
month = "November",
year = "2001",
pages = "164-169"
}