Computer Engineering Publications Database (2000-2018) Industrial Evaluation of DRAM SIMM Tests 
| Publication Type | Conference Paper |
|---|---|
| Title | Industrial Evaluation of DRAM SIMM Tests |
| Author(s) | A.J. van de Goor A. Paalvast |
| Publication Date | October 2000 |
| Conference Name | IEEE International Test Conference |
| Period | 3-5 October 2000 |
| Location | Atlantic City, USA |
| ISBN | 0-7803-6546-1 |
| Page Numbers | 426-435 |
| published | Published |
| Selected Publication | No |
| Note | Top Ten Best Papers Awards |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and A. Paalvast",
title = "Industrial Evaluation of DRAM SIMM Tests",
booktitle = "Proc. IEEE International Test Conference",
address = "Atlantic City, USA",
month = "October",
year = "2000",
pages = "426-435"
}
author = "A.J. van de Goor and A. Paalvast",
title = "Industrial Evaluation of DRAM SIMM Tests",
booktitle = "Proc. IEEE International Test Conference",
address = "Atlantic City, USA",
month = "October",
year = "2000",
pages = "426-435"
}