Computer Engineering Publications Database (2000-2018) Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices 
| Publication Type | Conference Paper |
|---|---|
| Title | Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices |
| Author(s) | Y. Wang S.D. Cotofana L. Fang |
| Publication Date | July 2012 |
| Conference Name | IEEE/ACM International Symposium on Nanoscale Architectures |
| Period | 4-6 July 2012 |
| Location | Amsterdam, The Netherlands |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Y. Wang and S.D. Cotofana and L. Fang",
title = "Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "Amsterdam, The Netherlands",
month = "July",
year = "2012",
pages = ""
}
author = "Y. Wang and S.D. Cotofana and L. Fang",
title = "Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "Amsterdam, The Netherlands",
month = "July",
year = "2012",
pages = ""
}