Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices 1294_statistical_reliability_analysis_of_nbti_impact_on_finfet_s.pdf

Publication TypeConference Paper
TitleStatistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices
Author(s)Y. Wang
S.D. Cotofana
L. Fang
Publication DateJuly 2012
Conference NameIEEE/ACM International Symposium on Nanoscale Architectures
Period4-6 July 2012
LocationAmsterdam, The Netherlands
ISBNt.b.s.
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Y. Wang and S.D. Cotofana and L. Fang",
title = "Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "Amsterdam, The Netherlands",
month = "July",
year = "2012",
pages = ""
}