Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices
Publication Type | Conference Paper |
---|---|
Title | Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices |
Author(s) | Y. Wang S.D. Cotofana L. Fang |
Publication Date | July 2012 |
Conference Name | IEEE/ACM International Symposium on Nanoscale Architectures |
Period | 4-6 July 2012 |
Location | Amsterdam, The Netherlands |
ISBN | t.b.s. |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Y. Wang and S.D. Cotofana and L. Fang",
title = "Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "Amsterdam, The Netherlands",
month = "July",
year = "2012",
pages = ""
}
author = "Y. Wang and S.D. Cotofana and L. Fang",
title = "Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "Amsterdam, The Netherlands",
month = "July",
year = "2012",
pages = ""
}