Analyzing Combined Impacts of Parameter Variations and BTI in Nano-scale Logical Gates 1297_analyzing_combined_impacts_of_parameter_variations_and_bti.pdf

Publication TypeConference Paper
TitleAnalyzing Combined Impacts of Parameter Variations and BTI in Nano-scale Logical Gates
Author(s)M.S. Khan
S. Hamdioui
Publication DateJune 2012
Conference Name1st Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale
Period1 June 2012
LocationAnnecy, France
ISBNt.b.s.
Page Numbers7-11
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui",
title = "Analyzing Combined Impacts of Parameter Variations and BTI in Nano-scale Logical Gates",
booktitle = "Proc. 1st Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale",
address = "Annecy, France",
month = "June",
year = "2012",
pages = "7-11"
}