Computer Engineering Publications Database (2000-2018) Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis 
| Publication Type | Conference Paper |
|---|---|
| Title | Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis |
| Author(s) | M.S. Khan S. Hamdioui H. Kukner P. Raghavan F. Catthoor |
| Publication Date | October 2012 |
| Conference Name | IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Period | 3-5 October 2012 |
| Location | Austin, USA |
| ISBN | t.b.s. |
| Page Numbers | 158-163 |
| published | Published |
| Selected Publication | Yes |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and H. Kukner and P. Raghavan and F. Catthoor",
title = "Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis",
booktitle = "Proc. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems",
address = "Austin, USA",
month = "October",
year = "2012",
pages = "158-163"
}
author = "M.S. Khan and S. Hamdioui and H. Kukner and P. Raghavan and F. Catthoor",
title = "Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis",
booktitle = "Proc. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems",
address = "Austin, USA",
month = "October",
year = "2012",
pages = "158-163"
}